num_sim_steps: 1.2e6
Ts:  1/400e6
// probe nodes for examining transient behavior
output: test end_sample=200e3
probe:  out ref vin pfdout sd_in div_val xi12.xor_out

// probe node for examining noise performance
output: test_noise start_sample=200e3
probe:  noiseout

global_param: in_gl=92.31793713 delta_gl=5.0 step_time_gl=100e3*Ts
//global_param: in_gl=92.1 delta_gl=0.0 step_time_gl=100e3*Ts

simulink_prototype:  [vin,out] = sd_synth_fast_simulink(sd_in,Ts)